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Naoe, Takashi; Teshigawara, Makoto; Futakawa, Masatoshi; Mizutani, Haruki; Muramatsu, Toshiharu; Yamada, Tomonori; Ushitsuka, Yuji*; Tanaka, Nobuatsu*; Yamasaki, Kazuhiko*
Proceedings of 8th International Congress on Laser Advanced Materials Processing (LAMP 2019) (Internet), 5 Pages, 2019/05
Laser cutting is one of the options in the disposal of radio-active waste, such as spallation neutron target vessel in J-PARC, etc. Due to unique characteristic of laser, such as non-contact system, it is more easily to provide remote-controlled system in comparison with conventional one, such as mechanical cutting machine, etc. However, a demerit of laser cutting is the sputter and fume caused by laser cutting, resulting in contamination with radio-active materials its surroundings. Recently it was developed that the spatter suppression technique by controlling laser beam profile in laser welding process. In order to apply this suppression technique to laser cutting, first of all, we attempted to observe the phenomenon at melting area during laser cutting using a high-speed video camera in order to make the physical model. The result showed that the appearance of fume and sputter were independently confirmed in the time evolution.
Mao, W.*; Fujita, Masaya*; Chikada, Takumi*; Yamaguchi, Kenji; Suzuki, Akihiro*; Terai, Takayuki*; Matsuzaki, Hiroyuki*
Surface & Coatings Technology, 283, p.241 - 246, 2015/12
Times Cited Count:3 Percentile:13.89(Materials Science, Coatings & Films)Single-phase nanocrystalline thin films of ErO (440) has been first prepared using Si (100) substrates by ion beam sputter deposition at 973 K at a pressure of 10 Pa and - annealing at 1023 K at a pressure of 10 Pa. Er silicides formed during the deposition are eliminated via the annealing, which results in the single phase and the smooth surface of the ErO thin films. The epitaxial relationship between Si (100) and ErO (110) is clarified by X-ray diffraction and reflection high energy electron diffraction.
Yamaguchi, Kenji
Shirisaidokei Handotai No Kagaku To Gijutsu, p.113 - 121, 2014/09
This article describes first the basic aspects of sputtering phenomena based on ion beam - solid interactions, followed by introduction of ion beam sputter deposition (IBSD) method for thin film fabrication. The article further introduces the experimental apparatus for IBSD application, equipped with an ion beam irradiation system for sputter-etching of the substrate surface. It is shown that this method is suitable for fabrication of semiconducting iron silicide film on Si substrate. The experimental results revealed that the obtained thin film is highly-oriented and continuous, forming atomically flat interface between film and the substrate.
Yamaguchi, Kenji; Shimura, Kenichiro; Udono, Haruhiko*; Sasase, Masato*; Yamamoto, Hiroyuki; Shamoto, Shinichi; Hojo, Kiichi
Thin Solid Films, 508(1-2), p.367 - 370, 2006/06
Times Cited Count:12 Percentile:49.71(Materials Science, Multidisciplinary)no abstracts in English
Shimura, Kenichiro; Yamaguchi, Kenji; Sasase, Masato*; Yamamoto, Hiroyuki; Shamoto, Shinichi; Hojo, Kiichi
Vacuum, 80(7), p.719 - 722, 2006/05
Times Cited Count:9 Percentile:34.33(Materials Science, Multidisciplinary)no abstracts in English
Shimura, Kenichiro; Yamaguchi, Kenji; Yamamoto, Hiroyuki; Sasase, Masato*; Shamoto, Shinichi; Hojo, Kiichi
Nuclear Instruments and Methods in Physics Research B, 242(1-2), p.673 - 675, 2006/01
Times Cited Count:6 Percentile:43.85(Instruments & Instrumentation)no abstracts in English
Shimura, Kenichiro; Yamaguchi, Kenji; Sasase, Masato*; Yamamoto, Hiroyuki; Shamoto, Shinichi; Hojo, Kiichi
Nuclear Instruments and Methods in Physics Research B, 242(1-2), p.676 - 678, 2006/01
Times Cited Count:0 Percentile:0.01(Instruments & Instrumentation)no abstracts in English
Yamaguchi, Kenji; Heya, Akira*; Shimura, Kenichiro; Katsumata, Toshinobu*; Yamamoto, Hiroyuki; Hojo, Kiichi
Thin Solid Films, 461(1), p.17 - 21, 2004/08
Times Cited Count:4 Percentile:25.12(Materials Science, Multidisciplinary)no abstracts in English
Yamaguchi, Kenji; Haraguchi, Masaharu*; Katsumata, Toshinobu*; Shimura, Kenichiro; Yamamoto, Hiroyuki; Hojo, Kiichi
Thin Solid Films, 461(1), p.13 - 16, 2004/08
Times Cited Count:10 Percentile:46.84(Materials Science, Multidisciplinary)no abstracts in English
Shimura, Kenichiro; Katsumata, Toshinobu*; Yamaguchi, Kenji; Yamamoto, Hiroyuki; Hojo, Kiichi
Thin Solid Films, 461(1), p.22 - 27, 2004/08
Times Cited Count:8 Percentile:41.01(Materials Science, Multidisciplinary)On the formation of -FeSi using Ion Beam Sputter Deposition (IBSD) method, sputter etching (SE) followed by thermal annealing is effective substrate treatment to obtain highly (100) oriented -FeSi on Si (100). However the best condition of these treatments are not yet known. In this work, the effect of sputter etching (SE) together with annealing process on the orientation of the film is investigated. In prior to the deposition of Fe, the substrate is irradiated by Ne ion with various energy and fluence followed by thermal annealing at 1027 K for 60 minuets. The overall results show the most suitable SE condition using Ne ion on IBSD method is the energy of 1keV with the fluence of 3010 ions/m.
Tobita, Kenji; Nishio, Satoshi; Konishi, Satoshi; Sato, Masayasu; Tanabe, Tetsuo*; Masaki, Kei; Miya, Naoyuki
Fusion Engineering and Design, 65(4), p.561 - 568, 2003/07
Times Cited Count:20 Percentile:77.2(Nuclear Science & Technology)no abstracts in English
Yamamoto, Hiroyuki; Saito, Takeru
Nuclear Instruments and Methods in Physics Research B, 206(1-4), p.42 - 46, 2003/05
Times Cited Count:14 Percentile:66.94(Instruments & Instrumentation)no abstracts in English
Saito, Takeru; Yamamoto, Hiroyuki; Yamaguchi, Kenji; Nakanoya, Takamitsu; Hojo, Kiichi; Haraguchi, Masaharu*; Imamura, Motoyasu*; Matsubayashi, Nobuyuki*; Tanaka, Tomoaki*; Shimada, Hiromichi*
Nuclear Instruments and Methods in Physics Research B, 206, p.321 - 325, 2003/05
Times Cited Count:7 Percentile:46.83(Instruments & Instrumentation)no abstracts in English
Haraguchi, Masaharu*; Yamamoto, Hiroyuki; Yamaguchi, Kenji; Nakanoya, Takamitsu; Saito, Takeru; Sasase, Masato*; Hojo, Kiichi
Nuclear Instruments and Methods in Physics Research B, 206, p.313 - 316, 2003/05
Times Cited Count:17 Percentile:72.74(Instruments & Instrumentation)no abstracts in English
Heya, Akira*; Haraguchi, Masaharu*; Yamamoto, Hiroyuki; Saito, Takeru*; Yamaguchi, Kenji; Hojo, Kiichi
Ishikawaken Kogyo Shikenjo Heisei-14-Nendo Kenkyu Hokoku, (52), p.9 - 12, 2003/00
no abstracts in English
Haraguchi, Masaharu; Yamamoto, Hiroyuki; Yamaguchi, Kenji; Sasase, Masato*; Nakanoya, Takamitsu; Saito, Takeru; Hojo, Kiichi
Shinku, 45(10), p.749 - 753, 2002/10
no abstracts in English
Nakano, Tomohide; Kubo, Hirotaka; Higashijima, Satoru; Asakura, Nobuyuki; Takenaga, Hidenobu; Sugie, Tatsuo; Itami, Kiyoshi
Nuclear Fusion, 42(6), p.689 - 696, 2002/06
Times Cited Count:46 Percentile:79.09(Physics, Fluids & Plasmas)no abstracts in English
Matsunami, Noriaki*; Sataka, Masao; Iwase, Akihiro; Inami, Takashi*; Kobiyama, Mamoru*
Journal of Nuclear Materials, 302(2-3), p.206 - 210, 2002/04
Times Cited Count:8 Percentile:47.9(Materials Science, Multidisciplinary)no abstracts in English
Matsunami, Noriaki*; Sataka, Masao; Iwase, Akihiro
Nuclear Instruments and Methods in Physics Research B, 193(1-4), p.830 - 834, 2002/01
Times Cited Count:27 Percentile:83.24(Instruments & Instrumentation)no abstracts in English
Nakanoya, Takamitsu; Sasase, Masato*; Yamamoto, Hiroyuki; Saito, Takeru; Hojo, Kiichi
Shinku, 45(1), p.26 - 31, 2002/01
no abstracts in English